The Materials Science Center commissioned a Panalytical X'Pert PRO high- resolution X-ray diffraction system in April of (2004). This instrument is suited for high-resolution x-ray diffraction from single crystals and epitaxial films, reflectometry from polycrystalline and amorphous thin films, and low-angle diffraction from polycrystalline thin films. The instrument is located in room 832 ERB. Contact Don Savage (dsavage@wisc.edu) for information about the X'Pert Pro or other MSC x-ray instruments that include the Bruker/Siemens Hi-Star 2-d detector system and the STOE powder x-ray diffractometer.