The Bede D³ system represents one of the most advanced instruments for diffraction analysis of semiconductor and other materials. It is designed to use a variety of x-ray optics ranging from slits to multiple reflection perfect crystals which can be easily switched from low- to high-resolution applications. The Bede D³ is driven by an extraordinary drive system which employs state-of-the-art DC torque motors and inductive position encoders to achieve a precision of 0.055 arcseconds with an absolute accuracy of better than 2 arcseconds over a full range of 360°. This performance is achieved with zero backlash and with a maximum slew speed of 15°/sec. The rapidly interchangeable optics of the D³ (being able to switch from high resolution multiple reflection monochromator and analyzer crystals to low resolution slits in a matter of minutes) coupled with the remarkable direct drive system makes the Bede system unsurpassed in a multiple user research environment. Diverse analyses such as double crystal rocking curve analyses, high resolution triple crystal reciprocal space mapping, surface reflectivity measurements and analyses of thin polycrystalline films can all be routinely handled with the Bede D³ system. It is equipped with an extended dynamic range (EDR) detector, which has a specified linear dynamic range of 10⁷ (0.15 counts/sec to 1.5´ 10⁶ counts/sec). The Bede D³ system works in conjunction with a high flux (18 kW) direct-drive Rigaku rotating anode x-ray generator; the high x-ray intensities that can be achieved with this generator makes our diffraction system capable of analyzing virtually any single crystal or polycrystalline material.